Soft x-ray photoelectron momentum microscope for multimodal valence band stereography

The photoelectron momentum microscope (PMM) in operation at BL6U, an undulator-based soft x-ray beamline the UVSOR Synchrotron Facility, offers a new approach for μm-scale momentum-resolved spectroscopy (MRPES). A key feature of PMM is that it can very effectively reduce radiation-induced damage by directly projecting single constant energy contour reciprocal space with radius few Å−1 or real 100 μm onto two-dimensional detector. This was applied to three-dimensional valence band structure E(k) and E(r) measurements (“stereography”) as functions photon (hν), its polarization (e), detection position (r), temperature (T). In this study, we described some examples possible measurement techniques using PMM. We successfully stereography technique MRPES selectively visualize single-domain twinned face-centered-cubic Ir thin films grown on Al2O3(0001) substrates. dependence intensity Au(111) surface state measured detail within bulk Fermi surface. By changing 1T-TaS2, clarified variations dispersion associated chiral charge-density-wave phase transitions. Finally, PMMs various electron analyzers were compared, advantages each discussed.